| Journal Rank | 12451 |
|---|---|
| Impact Score | 2.14 |
| H-Index | 75 |
| SJR | 0.401 |
Ieee transactions on device and materials reliability is a reputed research journal publish the research in the field/area related to Safety, Risk, Reliability and Quality (Q2); Electrical and Electronic Engineering (Q3); Electronic, Optical and Magnetic Materials (Q3). It is published by Institute of Electrical and Electronics Engineers Inc.. The journal has an h-index of 75. The overall rank of this journal is 12451. The more details like ISSN, Journal Quartile, SJR Score, ISSN, and other important details are provided in the following section.
| Journal Title | IEEE Transactions on Device and Materials Reliability |
|---|---|
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISSN | 15304388 |
| SJR | 0.401 |
| H-Index | 75 |
| Country | United States |
| Quartile | Q2 |
| Online Submission | Submit |
The latest impact score of Ieee transactions on device and materials reliability is 2.14.
Credit & Source: Scopus.