| Journal Rank | 26061 |
|---|---|
| Impact Score | 0.06 |
| H-Index | 7 |
| SJR | 0.104 |
Electronic device failure analysis is a reputed research journal publish the research in the field/area related to Electrical and Electronic Engineering (Q4); Safety, Risk, Reliability and Quality (Q4). It is published by ASM International. The journal has an h-index of 7. The overall rank of this journal is 26061. The more details like ISSN, Journal Quartile, SJR Score, ISSN, and other important details are provided in the following section.
| Journal Title | Electronic Device Failure Analysis |
|---|---|
| Publisher | ASM International |
| ISSN | 15370755 |
| SJR | 0.104 |
| H-Index | 7 |
| Country | United States |
| Quartile | Q4 |
| Online Submission | Submit |
The latest impact score of Electronic device failure analysis is 0.06.
Credit & Source: Scopus.